Semiconductor Engineer (Ph.D)

Semiconductor R&D Center, Samsung Electronics

đź“§ [email protected]; [email protected]


Education

Seoul National University (SNU)

Ph.D., Mechanical Engineering

Advisor: Prof. Byeng D. Youn

Seoul, Korea

Mar. 2018 - Aug.2024

Doctoral Dissertation: Multi-Timescale Electromechanical Identification and Stress-Reflective Modeling of Lithium-Ion Battery for Reliability-Based Design


University of Maryland, College Park (UMD)

Visiting Scholar, Mechanical Engineering

Advisor: Prof. Bongtae Han

Maryland, US

Jan. 2023-Apr.2023


Hanyang University (HYU)

B.S., Mechanical Engineering


Seoul, Korea

Mar. 2012 - Feb. 2012


Research Interest


Journals

[1] Useok Jeong, Keunsu Kim, Sang-Hun Kim, Hyunhee Choi, Byeng D. Youn, and Kyu-Jin Cho, “Reliability Analysis of a Tendon-driven Actuation for Soft Robots,” The International Journal of Robotics Research (IF 7.5), vol. 40(1), pp. 494-511, Jan 2021.

[2] Hyejeong Son, Hyunhee Choi, Wongon Kim, Byeng D Youn, Guesuk Lee, "A Comparative Study of Statistical Validation Metrics with Consideratin of Variance to Address Type II Errors in Statistical Model Validation,” Structural and Multidisciplinary Optimization (IF 3.6), vol. 65, 63, Jan 2022.

[3] Wongon Kim, Guesuk Lee, Hyejeong Son, Hyunhee Choi, and Byeng D. Youn, "Fatigue Crack Initiation and Growth Estimation in Engineering Product Development Using Digital Twin,” Reliability Engineering & System Safety (IF 9.4), vol. 226, 108721, Oct 2022.

[4] Sehui Jeong, Hyunhee Choi, Byeng D. Youn, and Hyejeong Son, “Statistical Prior Modeling with Radius-Uniform Distribution for a Correlation Hyperparameter in Bayesian Calibration,” Structural and Multidisciplinary Optimization (IF 3.6), vol. 66, 69 Mar 2023.

[5] Hyeonchan Lee, Wongon Kim, Hyejeong Son, Hyunhee Choi, Soo-Ho Jo, and Byeng D. Youn , “A New Initial Point Search Algorithm for Bayesian Calibration with Insufficient Statistical Information: Greedy Stochastic Section Search,” Structural and Multidisciplinary Optimization (IF 3.6), vol. 66, 124 May 2023.